Training

As a technical professional, you understand that having the right information at the right time can pay for itself many times over.

Our training courses employ both the latest in training technology and proven techniques for professional education.

Many of our courses may also be taught at your site or upon sufficient demand. Please contact us for more information.

Please select the course or location of interest for more information.
  93K SOC - Concurrent Test
This course is designed as a four-day workshop for the IC test engineer who is responsible for test programs on the Agilent 93000 Series SOC Tester. The course goal is to enable a test engineer to feel comfortable developing and debugging concurrent test programs on the 93000 SOC Series Tester
  93K SOC - Maintenance
This course will introduce the principles of Agilent 93000 system maintenance system support, including diagnostics, calibration and troubleshooting.
  93K SOC - Memory
Learn how to setup a memory test with provided test patterns and how to customize memory test patterns. To debug failures from a memory test and facilitate for address and data scrambling for a basic SRAM device and more complex SDRAM DIMM module. In addition, learn to handle refresh requirements to accommodate for redundancy repair.
  93K SOC - Mixed Signal
Plan appropriate test by utilizing the capabilities and performance of the analog modules of the Agilent SOC 93000 test system. Develop test programs for mixed-signal devices
  93K SOC - NP2500
This 5 day training at Agilent provides hands on experience with the NP high speed test solution. After attending this course the student will be able to setup and debug their high speed devices using the Agilent NP hardware and software.
  93K SOC - Part 1
Introduce test engineers (with no experience on the Agilent 83000 F-Series) into the SOC Series so that after the course they are able to setup and debug their devices on SOC testers. In addition, this course is intended to provide the skills required to solve more specific problems supported by the user documentation and Agilent application engineers. Focused on this goal the training course wants to achieve a solid understanding of: Software and hardware components How the various setup and debug tools and the associated software features are related to the corresponding testing tasks (e.g. setting up a device, creating vector data, debugging a failing test) and how to use them.
  93K SOC - Part 2
What you will learn : Event Datalogging Testing the DC behavior of a device Programming Interfaces Translating Test Programs
  94000 / 9490 Service Training
Learn system configuration basics Learn how to verify normal system operation Practice diagnosing system failures and isolating defective modules Learn how to provide preventive maintenance Practice calibrating and repairing the test system
  F330 Advanced
Create tests for complex devices using equation based timing and level set-ups. Timing and vector translation from simulation data to Agilent 83000 set-ups. "Top down" design of a testflow. Developing a test program for use in the production environment. Testing devices in parallel.
  F330 Basic
Start up the system Enter device paramaters Characterize devices using the interactive test functions Generate test flows
  F330 Memory Test
Set up a memory test with provided test patterns Customize memory test patterns Debug failures from a memory test Facilitate for address and data scrambling Handle refresh requirements Accommodate for redundancy repair
  F330 Mixed Signal
Upon completion of this course the student will be able to: Synchronize analog and digital resources Design a mixed signal test program Design a mixed signal DUT board
  F660 Basic
This application-driven course focuses on interactive rather than programmatic test development capabilities. Learn to start up the system, perform device fixturing, and use interactive test functions to characterize a sample device. Course content covers system usage, generation of test flows, high speed testing techniques and calibration, and use of the EDA links.
 

 
Look at your data. Go into details. Go even more into details. And even more.
>>>


     © 1996 - 2007 BCS Inc.
1